this adds parameters that can be setup by an external script for
compensating for temperature variation in gyros and accels using a 3rd
order polynomial
use regulated time for frequency noise to avoid spurious harmonics
SITL sensors must be true separate instances
don't compile in FFT structures if DSP disabled
FFT windows can be dynamically allocated
add harmonic notch dynamic tracking mode
unwind gyro window allocation in the case of failure
allow access to harmonic notch harmonics
this zeros the delta angle and delta velocity accumulators when a
sensor is unavailable for a period of 0.1s. This prevents garbage
values being passed into the EKF when a sensor dies and then becomes
available again some time later
https://github.com/ArduPilot/ardupilot/issues/11346
Allocate a notch filter per-IMU.
Update the notch filters in the backend at the sensor sample rate.
Allow raw logging of post-filtered gyro and accel values.
AP_InertialSensor: add parameters for push-to-log interval and count
AP_InertialSensor: rename BAT_RAW to BAT_OPT
This becomes a bitmask of options for the BatchSampler
AP_InertialSensor: rename 'fast sample' to 'sensorrate sample'
AP_InertialSensor: const sensor-rate filter method
AP_InertialSampler: remove hard-coding of sample rate multiplier
AP_InertialSensor: use parameter to enable/disable sensor-rate logging
AP_InertialSensor: use a parameter to control sensor-rate logging
AP_InertialSensor: allow backends to override sensor data multiplier
e.g. some accelerometers are sensitive over wider ranges than the default 16G
AP_Inertialsensor: correct sample rate multiplier
FIFO sensors produce data at a well known rate, but samples come in
bunches, so we can't use the system clock to calculate deltaT.
non-FIFO sensors produce data when we sample them, but that rate is
less regular due to timing jitter.
For FIFO sensors this changes makes us use a learned sample rate,
which allows for different clock speeds on sensor and system board.
For non-FIFO sensors we use the system clock to measure deltaT
the overall effect is a fix for sensors that produce samples at other
than the claimed datasheet rate.
Andrew Tridgell
Iampete1
Andy Piper
Peter Barker
Siddharth Purohit
Josh Henderson
Tom Pittenger
Jacob Walser
murata